 
 
 
 
 
 
 
 
 
 
This appendix lists acronyms and symbols specific to SWS in Tables D.1 and D.2. For a more general list of acronyms we refer to the ISO Handbook Volume I.
| acronym | Description | 
| AA | Auto Analysis - software used to process data, see Section 7.3 | 
| AAR | Auto Analysis Result file - output of AA, defined in Section A.4.1 | 
| AIT | Assembly and Integration Tests | 
| AIV | Assembly and Integration Verification | 
| AOT | Astronomical Observation Template - see Chapter 3 | 
| CAM | ISO Camera - one of the four instruments on board ISO | 
| CoCo | Configuration Control | 
| CSH | Compact Status History file, defined in Section A.2.2 | 
| CUS | Calibration Uplink System | 
| DAAR/Derive-AAR | The OLP stage that processes SPD data to the AAR level. See Section 7.3 | 
| DIDAC | Dutch ISO Data Analysis Centre at SRON in the Netherlands | 
| DSPD/Derive-SPD | The OLP stage that processes ERD data to the SPD level. See Section 7.2 | 
| EMC | Electro-Magnetic Compatibility | 
| EOHA | Executed Observation History per AOT (CHECK) | 
| EOHI | Executed Observation History per ICS | 
| ERD | Edited Raw Data - raw data from the satellite, defined in Section A.2.1 | 
| FITS | Flexible Image Transport System | 
| FM | Flight Model (of SWS) | 
| FPG | Focal Plane Geometry | 
| FS | Fouks-Schubert transient model | 
| FWHM | Full Width at Half Maximum | 
| FP | Fabry-Pérot Spectrometer | 
| FPU | Focal Plane Unit | 
| GEHK | General House Keeping | 
| IA/SIA | Interactive Analysis - a software package to analyse SWS data | 
| ICS | Instrument Command Sequence | 
| IDA | ISO Data Archive - the legacy archive in VILSPA, Spain | 
| IDPD | ISO Data Product Document - see [34] | 
| IDT | Instrument Dedicated Team | 
| ILT | Instrument Level Test (SWS laboratory test) | 
| IRPH | Instrument Reference Pointing History | 
| ISAP | ISO Spectral Analysis Package | 
| ISO | Infrared Space Observatory - home of SWS, LWS, CAM and PHOT | 
| ISOSDC | ISO Spectrometer Data Centre at MPE, Garching (Germany) | 
| ITK | Instrument Time Key - see the ISO Handbook Volume I for a description | 
| of this key | |
| JFET | Junction Field Effect Transistor | 
| LW | Long Wavelength section of SWS | 
| LWS | ISO Long Wavelength Spectrometer - one of the four instruments on board ISO | 
| LVDT | A measure of the angle of the scan mirror for the gratings. It is given the term | 
| `LVDT' as this angle is measured by a Linear Voltage Differential Transducer | |
| OLP | Off-Line Processing - the pipeline, also known as SPG | 
| OSIA | Observers SWS Interactive Analysis - IA without the specific calibration parts | 
| PA | Product Assurance | 
| PHT/PHOT | ISO Photo-polarimeter - one of the four instruments on board ISO | 
| QLA | Quick Look Analysis - a quick assessment carried out on the data | 
| PV | Performance Verification - Early phase in the mission | 
| RC | Resistor-Capacitance circuit responsible for curvature in the integration ramps | 
| RSRF | Relative Spectral Response Function | 
| RTA | Real Time Assessment - a quick assessment carried out on the data | 
| SED | Spectral Energy Distribution | 
| SIDT | SWS Instrument Dedicated Team | 
| SNR | Signal-to-Noise Ratio | 
| SOC | Science Operations Centre (Villafranca) | 
| SPD | Standard Processed Data file - output of DSPD, defined in Section A.3.1 | 
| SPG | Standard Product Generation - the pipeline, also known as OLP | 
| SPOPS | SWS Post-Operations | 
| SSO | Solar System Object. | 
| SW | Short Wavelength section of SWS | 
| SWGH | SWS Glitch History Data file - output of DSPD, defined in Section A.3.2 | 
| SWS | ISO Short Wavelength Spectrometer - one of the four instruments on board ISO | 
| TDATA | Transparent Data | 
| TDF | Telemetry Distribution Format | 
| TDT | Target Dedicated Time | 
| UTK | Uniform Time Key - see ISO Handbook Volume I for a description of this key | 
| ZLF | Zero Level Function in FS model | 
| symbol | Description | 
|  | Instantaneous gain in FS transient model | 
| Angle between optical axis and aperture (degree) | |
|  | Cross talk matrix | 
| Covariance matrix | |
|  | Quadratic misfit between model and data | 
|  | Fabry-Pérot gap width | 
|  | Grating constants (lines/mm) | 
|  | Data samples, measured readouts from the ERD. (bits) | 
|  | Angle between optical axis and detector (degree) | 
|  t | Time interval (s) | 
|  | Flux density (Jy) | 
|  | Gain factor | 
|  | Analogue to Digital conversion factor | 
|  | Flux conversion factor (Jy s/  V) | 
|  | Flat-field gain | 
|  | Photometric gain factor | 
|  | Pre-amplifier gain | 
|  | Gain factor due to RSRF | 
|  | Unit step function at t=0 | 
|  | Number of scan steps per band | 
|  | Number of scan steps per FWHM of spectral resolution | 
|  | Step size in scanner steps | 
|  | Wavelength | 
|  | Decay time in the FS transient model | 
|  | Milliarcseconds | 
|  | Fabry-Pérot order | 
|  | Number of integrations | 
|  | Number of samples taken from a single spectral resolution element | 
|  | Number of scans | 
|  | Number of steps | 
|  | Grating or FP order | 
|  | Dark current noise | 
|  | Offset | 
|  | Glitch height | 
|  | Spectral Resolution | 
|  | Signal Strength (  V/s) | 
|  | Signal in the dark current | 
|  | Standard deviation | 
|  | time (sec) | 
|  | Detector reset interval (sec) | 
|  | AC time constant | 
|  | (Modeled) readouts | 
|  | Zero level function in FS model | 
 
 
 
 
 
 
 
 
