This appendix lists acronyms and symbols specific to SWS in Tables D.1 and D.2. For a more general list of acronyms we refer to the ISO Handbook Volume I.
acronym | Description |
AA | Auto Analysis - software used to process data, see Section 7.3 |
AAR | Auto Analysis Result file - output of AA, defined in Section A.4.1 |
AIT | Assembly and Integration Tests |
AIV | Assembly and Integration Verification |
AOT | Astronomical Observation Template - see Chapter 3 |
CAM | ISO Camera - one of the four instruments on board ISO |
CoCo | Configuration Control |
CSH | Compact Status History file, defined in Section A.2.2 |
CUS | Calibration Uplink System |
DAAR/Derive-AAR | The OLP stage that processes SPD data to the AAR level. See Section 7.3 |
DIDAC | Dutch ISO Data Analysis Centre at SRON in the Netherlands |
DSPD/Derive-SPD | The OLP stage that processes ERD data to the SPD level. See Section 7.2 |
EMC | Electro-Magnetic Compatibility |
EOHA | Executed Observation History per AOT (CHECK) |
EOHI | Executed Observation History per ICS |
ERD | Edited Raw Data - raw data from the satellite, defined in Section A.2.1 |
FITS | Flexible Image Transport System |
FM | Flight Model (of SWS) |
FPG | Focal Plane Geometry |
FS | Fouks-Schubert transient model |
FWHM | Full Width at Half Maximum |
FP | Fabry-Pérot Spectrometer |
FPU | Focal Plane Unit |
GEHK | General House Keeping |
IA/SIA | Interactive Analysis - a software package to analyse SWS data |
ICS | Instrument Command Sequence |
IDA | ISO Data Archive - the legacy archive in VILSPA, Spain |
IDPD | ISO Data Product Document - see [34] |
IDT | Instrument Dedicated Team |
ILT | Instrument Level Test (SWS laboratory test) |
IRPH | Instrument Reference Pointing History |
ISAP | ISO Spectral Analysis Package |
ISO | Infrared Space Observatory - home of SWS, LWS, CAM and PHOT |
ISOSDC | ISO Spectrometer Data Centre at MPE, Garching (Germany) |
ITK | Instrument Time Key - see the ISO Handbook Volume I for a description |
of this key | |
JFET | Junction Field Effect Transistor |
LW | Long Wavelength section of SWS |
LWS | ISO Long Wavelength Spectrometer - one of the four instruments on board ISO |
LVDT | A measure of the angle of the scan mirror for the gratings. It is given the term |
`LVDT' as this angle is measured by a Linear Voltage Differential Transducer | |
OLP | Off-Line Processing - the pipeline, also known as SPG |
OSIA | Observers SWS Interactive Analysis - IA without the specific calibration parts |
PA | Product Assurance |
PHT/PHOT | ISO Photo-polarimeter - one of the four instruments on board ISO |
QLA | Quick Look Analysis - a quick assessment carried out on the data |
PV | Performance Verification - Early phase in the mission |
RC | Resistor-Capacitance circuit responsible for curvature in the integration ramps |
RSRF | Relative Spectral Response Function |
RTA | Real Time Assessment - a quick assessment carried out on the data |
SED | Spectral Energy Distribution |
SIDT | SWS Instrument Dedicated Team |
SNR | Signal-to-Noise Ratio |
SOC | Science Operations Centre (Villafranca) |
SPD | Standard Processed Data file - output of DSPD, defined in Section A.3.1 |
SPG | Standard Product Generation - the pipeline, also known as OLP |
SPOPS | SWS Post-Operations |
SSO | Solar System Object. |
SW | Short Wavelength section of SWS |
SWGH | SWS Glitch History Data file - output of DSPD, defined in Section A.3.2 |
SWS | ISO Short Wavelength Spectrometer - one of the four instruments on board ISO |
TDATA | Transparent Data |
TDF | Telemetry Distribution Format |
TDT | Target Dedicated Time |
UTK | Uniform Time Key - see ISO Handbook Volume I for a description of this key |
ZLF | Zero Level Function in FS model |
symbol | Description |
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Instantaneous gain in FS transient model |
Angle between optical axis and aperture (degree) | |
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Cross talk matrix |
Covariance matrix | |
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Quadratic misfit between model and data |
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Fabry-Pérot gap width |
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Grating constants (lines/mm) |
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Data samples, measured readouts from the ERD. (bits) |
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Angle between optical axis and detector (degree) |
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Time interval (s) |
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Flux density (Jy) |
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Gain factor |
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Analogue to Digital conversion factor |
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Flux conversion factor (Jy s/![]() |
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Flat-field gain |
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Photometric gain factor |
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Pre-amplifier gain |
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Gain factor due to RSRF |
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Unit step function at t=0 |
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Number of scan steps per band |
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Number of scan steps per FWHM of spectral resolution |
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Step size in scanner steps |
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Wavelength |
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Decay time in the FS transient model |
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Milliarcseconds |
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Fabry-Pérot order |
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Number of integrations |
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Number of samples taken from a single spectral resolution element |
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Number of scans |
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Number of steps |
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Grating or FP order |
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Dark current noise |
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Offset |
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Glitch height |
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Spectral Resolution |
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Signal Strength (![]() |
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Signal in the dark current |
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Standard deviation |
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time (sec) |
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Detector reset interval (sec) |
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AC time constant |
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(Modeled) readouts |
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Zero level function in FS model |