The line profile working group is composed of the following members :
Emmanuel Caux, Helmut Feuchtgruber, Pedro Garcia Lario, Anna di Giorgio, Cecile Gry (chair), Rosario Lorente, and Dieter Lutz.
The aim of the working group was to make sure that the necessary studies on line profiles were carried out and that the information needed by the users to analyse their spectroscopic data was made available to them. The present document is not a detailed description of the working group activities. Its purpose is rather to gather information on the line profile of the four ISO instruments.
For SWS and LWS, the studies performed during or after the ISO operations to characterize the line profiles have been reported in detail in documents written by members of the working group. In these cases, the information is not repeated here but we point to the documents so that the full information can be retrieved.
I-A- SWS Grating low resolution mode SWS 01
A detailed study of the resolution and its dependence
on wavelength and scanning speed can be found in the following document Spectral Resolution of SWS AOT 1 by R. Lorente.
I-B- SWS Grating full resolution modes SWS02 and SWS06
A detailed study of the instrumental profiles in these
modes can be found in
ISO-SWS
grating resolution and instrumental profile as measured by the full
resolution modes SWS02 and SWS06 by D. Lutz, H. Feuchtgruber and
J. Morfill.
The SWS profiles are Gaussians. Their FWHM values have
been implemented in
SIA and OSIA, via the RESOLUTION module.
I-C- SWS Fabry-Perot
The spectral resolution of the FP have been measured
before launch and is given in
Section 6.3 of the SWS Handbook
In-flight checks of the resolution values has been performed
with the internal
calibrator lines and confirm these values.
FP-SW: R = 41 900 +/-7
000 at 24.61 micron
FP-LW: R = 29 900 +/-3 600
at 24.78 micron
No indications have been found so far that the FP instrumental
profile deviates from
an Airy (Lorentzian) shaped profile.
II-B- Fabry-Perot profiles
The FP profiles has proven to be very sensitive
to detector memory (or "transient")
effects, currently still under study. The report on FP
profiles will thus be completed
after a transient effects correction procedure
will be available (in 2001).
The profile widths have been checked on actual observations. Gaussian fits performed on strong and narrow ion lines in M16 gave :
species | lambda microns | FWHM microns | sigma(FWHM) microns | resolution (lambda/FWHM) | ground-based FWHM |
Ar II | 6.98 | 0.16 | 0.02 | 44 | 0.18 |
S IV | 10.51 | 0.26 | 0.03 | 40 | 0.28 |
Ne III | 15.56 | 0.34 | 0.01 | 46 | 0.33 |
Measured FWHMs agree with ground-based FWHM within the measurement uncertainties, so the user is recommended to use the above linear relationship to estimate R.
Cécile Gry, ISO Data Centre, 6 April 2001.